REL-West, LLC – Systems and Services for MICROELECTRONICS Test Labs

ATS Device Cell
Ceramic Test Sockets with ATS technology
RW16A03-16P
Ceramic Test Socket
Ceramic Load Card
High-Temperature ceramic load cards for noise suppression and other applications.
HI-TEMPERATURE DIL ZIF 40 PIN

Reliability and Life Testing

REL-West, LLC,

Systems and Services for MICROELECTRONICS Test Labs

REL Systems

REL-West, LLC works exclusively with customers testing at temperatures from 200°C to 450°C.

We offer systems designed for stressing at high-temperature. From DIP ZIF ceramic test sockets to application specific REL Systems, Rel-West, LLC microelectronics test systems are your answer to high-temperature testing. REL-West, LLC is your Reliability and Life Testing partner.

ATS Technology

The principle behind Active Thermal Surface (ATS) is direct thermal transfer to the device under test. REL-West, LLC ATS equipped systems provide high-temperature stability and high efficiency thermal transfer.

Ceramic Test Sockets

DIL ZIF Test Sockets for use at temperatures up to 450°C

High-Temp Circuit Boards

Load Cards, Interconnect Boards and more